Researchers at the University of Southern California (USC) have developed the world’s first fully integrated chip-based sensor capable of performing pulse-mode Electron Paramagnetic Resonance (EPR) spectroscopy. This breakthrough significantly reduces the size and cost of EPR technology, opening new possibilities for applications in electronic components testing, semiconductor analysis, and quantum computing.
A Breakthrough in Chip-Based EPR Technology
USC Ph.D. student Ray Sun and Professor Constantine Sideris have successfully designed a 1.5 mm × 2 mm semiconductor chip that integrates both continuous-wave (CW) and pulse-mode EPR spectroscopy. This marks the first time pulse-mode EPR has been achieved on a highly integrated, portable platform, enabling new capabilities in electronic components analysis and defect detection.
Enhancing Semiconductor Testing and Materials Analysis
Traditional EPR instruments are bulky, expensive, and primarily used for research on free radicals, material defects, and quantum systems. The USC-developed chip-based EPR sensor revolutionizes this field by providing a compact and cost-effective solution with broad applications in the electronics industry, including:
● Semiconductor Quality Control: EPR is widely used to analyze defects and doping in semiconductor materials. The new chip-based sensor allows manufacturers to integrate EPR analysis directly into the production line, improving process control and quality assurance.
● Reliability Testing of Electronic Components: The ability to detect material degradation and defect distribution makes the chip a valuable tool for ensuring the longevity and reliability of connectors, capacitors, resistors, and other critical electronic components.
● Quantum Computing and Advanced Materials Research: Pulse-mode EPR provides detailed insights into electron spin states, playing a crucial role in the development of next-generation quantum devices and high-performance electronic components.
Key Innovations in Chip-Based EPR
Unlike conventional EPR spectrometers that rely on superconducting magnets and high-power microwave sources, USC’s chip-based sensor integrates an on-chip inductor coil within an LC voltage-controlled oscillator (VCO) to generate a 14 GHz microwave signal. The research team introduced novel circuit architectures to achieve nanosecond-scale pulse control, a critical requirement for pulse-mode EPR.
Additionally, the chip features two independent sensing cells, allowing multiple experiments to be conducted simultaneously—something traditional EPR spectrometers cannot achieve without complex hardware modifications. This innovation drastically reduces cost and enhances the accessibility of EPR technology for commercial applications.
Advancing Smart Electronics and Automated Testing
The introduction of chip-based EPR sensors is set to transform electronic component testing by enabling smart, portable, and automated analysis solutions. With miniaturized EPR capabilities, manufacturers can implement real-time quality control, optimize supply chains, and ensure higher reliability in components production.
USC researchers first presented this breakthrough at the 2024 International Solid-State Circuits Conference (ISSCC) and later published their findings in IEEE Transactions on Biomedical Circuits and Systems. As chip-based EPR technology continues to evolve, its impact on electronic components testing, semiconductor manufacturing, and advanced materials research is expected to be profound, shaping the future of the electronics industry.
